Electrical circuits

Results: 2145



#Item
921Standards organizations / Electrical engineers / Institute of Electrical and Electronics Engineers / Technology / Electromagnetism / IEEE Transactions on Multimedia / Mac Van Valkenburg / Jacek M. Zurada / Behzad Razavi / Engineering / International nongovernmental organizations / Professional associations

School of Electrical Engineering & Computer Science Faculty Profiles Analog/Mixed Signal Design Circuits

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Source URL: eecs.oregonstate.edu

Language: English - Date: 2013-12-04 17:50:39
922Power electronics / Energy storage / Power supplies / Electrical circuits / Rectifier / Power factor / DC-to-DC converter / Diode bridge / Capacitor / Electromagnetism / Electrical engineering / Electronic engineering

Experimental Verification of the Efficiency/Power-Density (η–ρ) Pareto Front of Single-Phase Double-Boost and TCM PFC Rectifier Systems

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Source URL: www.pes.ee.ethz.ch

Language: English - Date: 2013-07-03 06:06:20
923Power electronics / Power supplies / Electrical circuits / Capacitors / Charge pump / DC-to-DC converter / Switched capacitor / Voltage doubler / Decoupling capacitor / Electromagnetism / Electrical engineering / Electronic engineering

A 4.6W/mm² Power Density 86% Efficiency On-Chip Switched Capacitor DC-DC Converter in 32 nm SOI CMOS

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Source URL: www.pes.ee.ethz.ch

Language: English - Date: 2013-10-08 04:07:03
924Analog circuits / Power electronics / Power supplies / Automation / DC-to-DC converter / Resistor / Joule heating / Inverter / AC power / Electromagnetism / Electrical engineering / Electric power

GUIDELINES FOR PAPERS

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Source URL: esrdc.mit.edu

Language: English - Date: 2011-12-21 15:27:12
925Energy storage / Electric motors / Analog circuits / Capacitor / Inductor / Synchronous motor / Alternator / Voltage regulator / Rectifier / Electromagnetism / Electrical engineering / Energy

> REPLACE THIS LINE WITH YOUR PAPER IDENTIFICATION NUMBER (DOUBLE-CLICK HERE TO EDIT) < 1 Medium Voltage DC Testbed: Generator System GS-1

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Source URL: esrdc.mit.edu

Language: English - Date: 2009-10-06 11:05:15
926Bipolar junction transistor / Transistor / Electronics / Early effect / Biasing / Common emitter / Logic families / Integrated circuits / 2N2222 / Electrical engineering / Electronic engineering / Single-stage transistor amplifiers

\\ Proc. IEEE 2004 Int. Conference on Microelectronic Test Structures, Vol 17, March[removed]

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Source URL: ece.wpi.edu

Language: English - Date: 2008-02-25 14:57:43
927Electronic engineering / Electrical engineering / Equivalent circuit / Electrical network / Capacitor / Reference circuit / RL circuit / Electronics / Electromagnetism / Electronic circuits

Microsoft Word - Document2

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Source URL: www.wvup.edu

Language: English - Date: 2013-07-26 17:13:11
928Integrated circuits / Digital electronics / Electronic design / MOSFET / Very-large-scale integration / CMOS / Semiconductor device fabrication / Threshold voltage / Electronic engineering / Electronics / Electrical engineering

Next-generation Key CMOS Technologies Variation-Aware Design for Nanometer Generation LSI HIRATA Morihisa, SHIMIZU Takashi, YAMADA Kenta Abstract Advancement in the microfabrication of semiconductor chips has made the v

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Source URL: www.nec.com

Language: English - Date: 2012-09-11 09:28:30
929Logic families / Digital electronics / Electronic design / Integrated circuits / High-k dielectric / Transistors / CMOS / Hafnium / Threshold voltage / Electronic engineering / Electrical engineering / Electronics

Innovative Common Technologies to Support State-of-the-Art Products A New High-k Transistor Technology Implemented in Accordance with the 55nm Design Rule Process FUKASE Tadashi, NAKAHARA Yasushi, TAKAHASHI Toshifumi, I

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Source URL: www.nec.com

Language: English - Date: 2013-10-01 21:40:08
930Electronic engineering / Integrated circuits / Electrical engineering / Electrical wiring / Very-large-scale integration / 45 nanometer / Renesas Electronics / NEC / Reliability engineering / Electronics / Semiconductor companies / Technology

System Device Technology Domain Technology for High Reliability System LSIs MOCHIZUKI Yasunori, HAYASHI Yoshihiro, ODA Noriaki, TAKEUCHI Kiyoshi, TAKEDA Koichi Abstract

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Source URL: www.nec.com

Language: English - Date: 2013-10-01 21:34:04
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